Posts in Category SPM / AFM

HF2PLL for KPFM Applications

on 14.04.2013 at 13:17 by andreas
Kelvin Probe Force Microscopy (KPFM) is a scanning technique that allows the detection of a electrostatic potential distribution of a surface. The HF2PLL supports several variants of KPFM, some of them are mentioned in this post. Amplitude modulated KPFM (AM-KPFM) […]

Q-Control Example VI Tutorial

on 04.12.2012 at 19:45 by andreas
Using a Zurich Instruments lock-in amplifier, you are enabled to measure the quality factor of an arbitrary resonator – typically a resonant beam used in non-contact atomic force microscopy (NC-AFM) applications. This can be useful e.g. to increase phase sensitivity […]

Using TipProtect to extend AFM tip life expectancy

on 03.12.2012 at 14:51 by andreas
Using a Zurich Instruments Lock-In amplifier, you are enabled to perform a multitude of AFM measurement modes. Particularly interesting is NC-AFM operation which makes use of the built-in PLL capability. Earlier, a user could easily crash his tip into a […]

Connecting the Nanosurf Manual Controller to a Zurich Instruments HF2LI or HF2PLL

on 02.04.2012 at 09:39 by andreas
In March 2011, Nanosurf and Zurich Instruments announced a cooperation to establish the HF2PLL as official upgrade path for Nanosurf’s EasyPLL. This post shows how to connect Nanosurf’s Manual Controller to the Zurich Instruments HF2PLL. The Manual Controller combined with […]