Blog of Andreas Senn

Kelvin Probe Force Microscopy (KPFM) is a scanning technique that allows the detection of a electrostatic potential distribution of a surface. The HF2PLL supports several variants of KPFM, some of them are mentioned in this post. Amplitude modulated KPFM (AM-KPFM) […]

This article describes how to simulate a band pass filter or resonator using the HF2LI lock-in amplifier. The digitally tunable parameters make it very versatile and e.g. allow to use it for benchmarking a phase locked loop. Hardware Requirements To […]

Using a Zurich Instruments lock-in amplifier, you are enabled to measure the quality factor of an arbitrary resonator – typically a resonant beam used in non-contact atomic force microscopy (NC-AFM) applications. This can be useful e.g. to increase phase sensitivity […]

Using a Zurich Instruments Lock-In amplifier, you are enabled to perform a multitude of AFM measurement modes. Particularly interesting is NC-AFM operation which makes use of the built-in PLL capability. Earlier, a user could easily crash his tip into a […]