Posts in Category Applications

Workshop on Nanomechanics – Montpellier, France

on 09.12.2016 at 11:24 by Romain Stomp on Blog of Romain Stomp
This workshop organized with CNRS customers in Montpellier among the RéMiSoL network (Réseau des Microscopies à Sondes Locales) focused on all aspects of contact mechanics at the nanoscale and in particular using resonant contact AFM mode (CR-AFM). Contact Resonance tracking measures the […]

Pass/Fail Tests for Failure Analysis

on 08.06.2015 at 16:34 by Romain Stomp on Blog of Romain Stomp
For quality control in manufacturing process, there are many ways to tests for transistors or other component failure, but for high throughput verification usually simple Pass/Fail tests are required. Since devices are tested for various functions, different tests need to be performed […]

DFRT-PFM workshop – INL Lyon

on 27.11.2014 at 16:54 by Romain Stomp on Blog of Romain Stomp
Earlier in November 2014, Zurich Instruments participated in a 2-day workshop on Piezoresponse Force Microscopy (PFM) organized by the Institut des Nanotechnologies de Lyon (INL) and the CNRS network RéMiSoL (Réseau des Microscopies à Sondes Locales). Starting with some theoretical introduction […]

Synchronization of HF2LI/UHFLI with External Scan Engines for Image Acquisition

on 10.09.2014 at 23:50 by Romain Stomp on Blog of Romain Stomp
Since a lock-in amplifier is most of all used for synchronous measurements, it comes at no surprise that many HF2 or UHF users want to synchronize saved demodulated sample with their scan generator either for mapping, scanning or imaging in […]

How to Achieve More Stable Z-feedback in FM-AFM Mode

on 15.05.2014 at 16:38 by Romain Stomp on Blog of Romain Stomp
The challenge with FM-AFM mode (or NC-AFM for Non-Contact Atomic Force Microscopy) is that tip-sample interaction can be either attractive (negative frequency shift, -df) or repulsive (positive frequency shift, +df) which leads to different parameter settings for the Z feedback […]

What it Takes for High-Speed AFM Measurements

on 19.02.2014 at 14:06 by Romain Stomp on Blog of Romain Stomp
Typically for biological and catalysis applications, time matters! And AFM images that record in 10 minutes or more are not acceptable. We often receive inquiries about what constitutes a complete solution for ‘fast AFM’ and what Zurich Instruments can offer […]

Ring-Down Method for Rapid Determination of High Q-factor Resonators

on 18.12.2013 at 15:45 by Romain Stomp on Blog of Romain Stomp
With the miniaturization of circuits and components such as MEMS and now also NEMS (Nano-Electro-Mechanical Systems), the variety and quality of macro-fabricated devices have dramatically increased, leading to packaged or embedded systems with particularly sensitive electromechanical properties. The basic properties, […]

Tracking Resonance Frequency without Phase: the DFRT Method

on 18.10.2013 at 18:47 by Romain Stomp on Blog of Romain Stomp
For high Q-factor resonator (> 500), it is a common method for SPM application to use a Phase Locked Loop (PLL) to track the change in cantilever frequency: the high phase sensitivity at 90° guarantees accurate measurements and stable PID […]

How to set-up Kelvin Probe Feedback (FM-KPFM) with Direct Sideband Detection

on 28.08.2013 at 15:50 by Romain Stomp on Blog of Romain Stomp
HF2 users can already find valuable information on the HF2LI-MOD option in earlier blogs such as in Exploring the HF2LI-MOD: Measuring Bessel Functions for the difference between tandem and (direct) sideband detection or even schematics of various KPFM configurations in […]

Exploring the HF2LI-MOD: Measuring Bessel Functions

on 20.10.2011 at 12:40 by Andrin on Blog of Andrin Doll
In this post, I demonstrate the capabilities of the HF2LI-MOD upgrade by demodulating 4 FM sidebands simultaneously. With the help of a basic sweep routine programmed in LabVIEW, I measure 5 Bessel functions by direct sideband demodulation of an FM signal. This post might give you an inspiration on how to improve your measurement sensitivity by introducing an advanced demodulation scheme of multiple sidebands.

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