Zurich Instruments Users Meeting in Leiden, The Netherlands
on 17.06.2015 at 11:58 by Daniel on Blog of Daniel Wright
On June 3rd my colleague Romain Stomp and I welcomed Zurich Instruments users with a focus in Scanning Probe Microscopy (SPM) to visit us for the day at Leiden University in the Netherlands. In the morning, Romain shared his expertise with a presentation outlining […]