Posts in Category Measurements

5-tips to Improve Your Impedance Measurement

on 02.04.2020 at 07:45 by Meng on Blog of Meng Li
Introduction Impedance applications often have different requirements, but the common goals are similar; get the best possible accuracy, precision, and repeatability. This blog post will guide you to the best measurement settings to improve your impedance measurements. It will help […]

DC I-V Sweeps on the MFIA

on 10.01.2020 at 09:07 by Tim Ashworth on Blog of Tim Ashworth
Characterizing the impedance of components and materials with the MFIA is done by necessity with an AC signal. However, the MFIA and MFLI can also take DC measurements. This blog post shows how easy it is to take DC measurements, […]

Electrochemical Impedance Spectroscopy of Tap Water with the MFIA

on 06.01.2020 at 18:09 by Meng on Blog of Meng Li
Introduction Electrochemical impedance spectroscopy (EIS) is a popular non-destructive technique to characterize the physicochemical properties of materials, particularly at the solid-liquid (or electrode-electrolyte) interface. Despite the complexity of the measured data, EIS can be used to study many electrochemical devices […]

Bioimpedance of a Muscle Contraction with the MFIA

on 22.11.2019 at 09:20 by Tim Ashworth on Blog of Tim Ashworth
Impedance measurements of biological tissue are commonly used in bio-engineering and life sciences to assess the condition and composition of tissue in a non-invasive, reproducible way.  In addition, bio-impedance measurements, also known as bioelectrical impedance analysis (BIA) or electrical impedance […]

Automated 2D Impedance Sweep on the MFIA

on 28.08.2019 at 15:43 by Meng on Blog of Meng Li
Many devices and materials exhibit an impedance which depends on both frequency and other parameters such as bias voltage. To fully characterize the impedance of these samples requires an impedance analyzer with the ability to sweep in two dimensions. The MFIA (and MFLI with MF-IA option) can be easily controlled via any of the five included APIs to open up the full parameter space of impedance analysis.This blog details a short script for Python 3.7 which demonstrates the ease in which multi-dimension impedance sweeps can be carried out.

Measuring low ESL and low ESR of a DC-Link Capacitor with the MFIA Impedance Analyzer

on 10.06.2019 at 09:25 by Tim Ashworth on Blog of Tim Ashworth
Introduction: This blog post describes how the MFIA (and MFLI with MF-IA option), can characterize the equivalent series inductance (ESL) and equivalent series resistance (ESR) of a DC-Link capacitor typically used in power inverters for electric vehicles. The ESR and […]

Gated data transfer for increased data sampling rate on the MFIA and MFLI

on 19.12.2018 at 14:42 by Tim Ashworth on Blog of Tim Ashworth
Introduction For measurements of signals which are rapidly changing, for example, when measuring capacitance transients in Deep Level Transient Spectroscopy (DLTS), high temporal resolution is required. In its standard operating configuration, the MFIA (or MFLI with MF-IA option) can sample […]

Square pulses for DLTS measurements on the MFIA

on 22.08.2018 at 16:00 by Tim Ashworth on Blog of Tim Ashworth
Producing square voltage pulses and capturing capacitance transients This blog post shows how to produce square voltage pulses and capture the resulting capacitance transients on a short timescale (20 us) for example, for Deep-level Transient Spectroscopy (DLTS) measurements. Using the LabOne Threshold Unit […]

Rapid and Accurate C-V Measurements on the MFIA

on 19.08.2018 at 15:50 by Tim Ashworth on Blog of Tim Ashworth
Fast C-V measurements up to 3000 V/s This blog post demonstrates the ability of the MFIA (also MFLI with MF-IA option) to measure capacitance on a short timescale (20 us) as a function of DC bias voltage, for example, for […]

How to measure PLL/PID bandwidth under real experimental conditions

on 14.11.2017 at 10:52 by Romain Stomp on Blog of Romain Stomp
With the merging of PLL and PID tab in LabOne for MFLI and UHFLI, the PID Advisor section is now identical for both type of feedback loops and various system models can be tested. After all, a Phase Locked-Loop (PLL) […]

Compensating delay-induced phase shifts for high-frequency resonators

on 20.02.2017 at 14:31 by Romain Stomp on Blog of Romain Stomp
Phase-Locked Loop (PLL) or other PID controllers on nano-mechanical resonators rely on clean phase signals that exhibit large slope, or significant phase shift, around the resonance frequency. For really high-frequency NEMS and opto-mechanical systems above a few tens or hundreds […]

Better Amplitude Accuracy with MFLI Analog Adder

on 07.03.2016 at 17:47 by Bruno Küng on Blog of Bruno Küng
Many lock-in applications use a drive signal consisting of a small AC excitation voltage and larger DC offset voltage, for example differential conductance (dI/dV) measurements. Users of the MFLI Lock-in amplifier have the choice between two methods to generate such a signal: […]

Characterization of Dye-Sensitized Solar Cell Impedance at Low Frequencies with HF2IS Impedance Spectroscope

on 03.07.2015 at 12:29 by James Wei on Blog of James Wei
Co-author and main contributor: Dr. Antonio Braga Introduction The electrical impedance spectroscopy (EIS) technique is used to characterize the physical-chemical processes of the dye-sensitized solar cells (DSSC) using different types of metal oxides semiconductors, dyes or electrolytes [1]. The EIS […]

Pass/Fail Tests for Failure Analysis

on 08.06.2015 at 16:34 by Romain Stomp on Blog of Romain Stomp
For quality control in manufacturing process, there are many ways to tests for transistors or other component failure, but for high throughput verification usually simple Pass/Fail tests are required. Since devices are tested for various functions, different tests need to be performed […]

Deep Level Transient Spectroscopy Using HF2LI Lock-in Amplifier

on 23.05.2015 at 10:58 by James Wei on Blog of James Wei
Co-author and main contributor: Dr. Antonio Braga Introduction A very small concentration of lattice point defects, or simply defects, such as vacancies, impurities, dislocations, grain boundaries or cavities, are responsible for creating many different properties in semiconductors. Defects play a crucial […]

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