Posts tagged MFLI

Webinar Q&A – Nanoscale light-matter interactions

on 12.08.2020 at 08:10 by claudius on Blog of Claudius Riek
This blog post answers questions asked from the audience during our webinar “Nanoscale light-matter interaction” hosted by Physics Today and with our guest speaker Markus Raschke and his student Samuel Johnson. The webinar was recorded and is available on Demand […]

Webinar Q&A – Optimize signal acquisition for optical measurements

on 08.07.2020 at 12:23 by claudius on Blog of Claudius Riek
This blog post answers the many appreciated questions from the audience during the two recent webinar events “Optimize signal acquisition for optical Measurements” and “Optimize signal acquisition for Optics and Photonics measurements”. Both events were recorded and are available here […]

Multiplexed Impedance Measurements with the MFIA

on 17.06.2020 at 13:43 by Meng on Blog of Meng Li
Introduction Having more impedance measurement channels is often desirable in many applications. For instance, in electrical impedance tomography (EIT), it is common to have many channels to achieve enough spatial resolution (144 electrodes on the thorax) [1]. Naturally, this can […]

Webinar Summary – Optimize signal acquisition for optics and photonics measurements

on 16.06.2020 at 09:07 by claudius on Blog of Claudius Riek
This blog post accompanies the two webinars “Optimize the Signal Acquisition for Optical Measurements” and “Optimize the Signal Acquisition for Optics and Photonics measurements”. Thank you to everybody who joined the live event and participated actively by asking so many […]


on 24.09.2019 at 11:05 by Meng on Blog of Meng Li
很多器件和材料的阻抗都受到频率和其它参数(例如DC偏置电压)的影响。为了能够完整的表征这些样品,我们需要一种能在两个维度下进行参数扫描的阻抗分析仪。通过使用LabOne自带的任意5个API之一,我们可以轻易控制MFIA阻抗分析仪(或者MFLI锁相放大器和MF-IA升级选件)来进行这种全面参数分析。本文将详细说明如何使用简短的Python 3.7的程序,进行多参数维度的阻抗扫描。

Automated 2D Impedance Sweep on the MFIA

on 28.08.2019 at 15:43 by Meng on Blog of Meng Li
Many devices and materials exhibit an impedance which depends on both frequency and other parameters such as bias voltage. To fully characterize the impedance of these samples requires an impedance analyzer with the ability to sweep in two dimensions. The MFIA (and MFLI with MF-IA option) can be easily controlled via any of the five included APIs to open up the full parameter space of impedance analysis.This blog details a short script for Python 3.7 which demonstrates the ease in which multi-dimension impedance sweeps can be carried out.

Connect MFLI with External Signal Generator

on 26.07.2019 at 16:18 by Marco Brunner on Blog of Marco Brunner
This blog describes how to use an MFLI lock-in amplifier with an external reference frequency. The reference frequency comes from a signal generator Model 6221 from Keithley which is used to apply higher voltage pulses or sinusoidal signals on the […]


on 17.07.2019 at 14:59 by Meng on Blog of Meng Li
直流支撑电容器(DC-link 电容器)本身和接口的ESL和ESR对绝缘栅双极晶体管(IGBT)开关模组的性能有着很大的影响。当IGBT模组关闭时,瞬时产生的电压浪涌会储存在寄生电感之中。为了降低或者消除此电压浪涌的影响,设计低ESL的直流支撑电容器至关重要。在本文中,我们将使用MFIA阻抗分析仪和专用的低ESL阻抗测试夹具来验证标称的器件参数。在1 kHz到5 MHz的测试频率范围内,最低的串联等效电感(ESL)仅为9.5 nH (742 kHz),而最低的串联等效电阻(ESR)仅为0.7 mOhm (11 kHz)。

Output Low-Frequency Sinusoidal Signal on the AUX Output of MFLI

on 30.05.2017 at 14:42 by Marco Brunner on Blog of Marco Brunner
  This blog shows how to output sinusoidal signals on the AUX Output with the MD multi-demodulator option. Keep in mind that the AUX output are not designed to output sinusoidal signals as the Signal Output.   Setup 1. On AUX […]

Better Amplitude Accuracy with MFLI Analog Adder

on 07.03.2016 at 17:47 by brunok on Blog of Bruno Küng
Many lock-in applications use a drive signal consisting of a small AC excitation voltage and larger DC offset voltage, for example differential conductance (dI/dV) measurements. Users of the MFLI Lock-in amplifier have the choice between two methods to generate such a signal: […]

Eddy Current Testing with MFLI Lock-In Amplifier

on 05.08.2015 at 12:07 by Marco Brunner on Blog of Marco Brunner
This blog describes a method to detect material defects. Eddy current measurements are used for non-destructive material testing (NDT). An alternating magnetic field is penetrating a sample. The material defect is detected by a phase shift. In the first part […]