Posts tagged Users’ Meeting

Zurich Instruments Users Meeting in Leiden, The Netherlands

on 17. June 2015 at 11:58 by Daniel
On June 3rd my colleague Romain Stomp and I welcomed Zurich Instruments users with a focus in Scanning Probe Microscopy (SPM) to visit us for the day at Leiden University in the Netherlands. In the morning, Romain shared his expertise with a presentation outlining […]