Posts in Category Measurements

How to measure PLL/PID bandwidth under real experimental conditions

on 14.11.2017 at 10:52 by Romain Stomp
With the merging of PLL and PID tab in LabOne for MFLI and UHFLI, the PID Advisor section is now identical for both type of feedback loops and various system models can be tested. After all, a Phase Locked-Loop (PLL) […]

Compensating delay-induced phase shifts for high-frequency resonators

on 20.02.2017 at 14:31 by Romain Stomp
Phase-Locked Loop (PLL) or other PID controllers on nano-mechanical resonators rely on clean phase signals that exhibit large slope, or significant phase shift, around the resonance frequency. For really high-frequency NEMS and opto-mechanical systems above a few tens or hundreds […]

Pass/Fail Tests for Failure Analysis

on 08.06.2015 at 16:34 by Romain Stomp
For quality control in manufacturing process, there are many ways to tests for transistors or other component failure, but for high throughput verification usually simple Pass/Fail tests are required. Since devices are tested for various functions, different tests need to be performed […]

DFRT-PFM workshop – INL Lyon

on 27.11.2014 at 16:54 by Romain Stomp
Earlier in November 2014, Zurich Instruments participated in a 2-day workshop on Piezoresponse Force Microscopy (PFM) organized by the Institut des Nanotechnologies de Lyon (INL) and the CNRS network RéMiSoL (Réseau des Microscopies à Sondes Locales). Starting with some theoretical introduction […]

What it Takes for High-Speed AFM Measurements

on 19.02.2014 at 14:06 by Romain Stomp
Typically for biological and catalysis applications, time matters! And AFM images that record in 10 minutes or more are not acceptable. We often receive inquiries about what constitutes a complete solution for ‘fast AFM’ and what Zurich Instruments can offer […]

Ring-Down Method for Rapid Determination of High Q-factor Resonators

on 18.12.2013 at 15:45 by Romain Stomp
With the miniaturization of circuits and components such as MEMS and now also NEMS (Nano-Electro-Mechanical Systems), the variety and quality of macro-fabricated devices have dramatically increased, leading to packaged or embedded systems with particularly sensitive electromechanical properties. The basic properties, […]

Tracking Resonance Frequency without Phase: the DFRT Method

on 18.10.2013 at 18:47 by Romain Stomp
For high Q-factor resonator (> 500), it is a common method for SPM application to use a Phase Locked Loop (PLL) to track the change in cantilever frequency: the high phase sensitivity at 90° guarantees accurate measurements and stable PID […]

DC Offsets Measurement with the HF2LI Lock-in Amplifier

on 04.10.2013 at 11:55 by Romain Stomp
At first thought, DC measurements might be outside the scope of standard lock-in amplifiers. With the HF2LI one has several tools to monitor and record the DC offset while measuring the modulated signal. In practice, many customers need to record […]