Posts in Category Tips & Tricks

Webinar Summary – Boost Your SPM Applications: From Kelvin Probe to Time-Resolved Measurements

on 19.10.2020 at 17:03 by Romain Stomp
Following up on the webinar dedicated to Kelvin Probe Force Microscopy (KPFM) techniques, I’d like to post a short summary in this blog as well as answers to most questions raised during this event. The recording of this webinar can […]

Fast auto-approach with MFLI Threshold Unit to control stepper motor

on 22.02.2017 at 11:19 by Romain Stomp
In many applications where the distance between two objects need to be reduced to a predefined gap, the ability to control a stepper motor with clear stop conditions from different sensors is of high practical interest. Such functionality can be […]

Compensating delay-induced phase shifts for high-frequency resonators

on 20.02.2017 at 14:31 by Romain Stomp
Phase-Locked Loop (PLL) or other PID controllers on nano-mechanical resonators rely on clean phase signals that exhibit large slope, or significant phase shift, around the resonance frequency. For really high-frequency NEMS and opto-mechanical systems above a few tens or hundreds […]

LabOne for HF2: using digital lines as trigger sources

on 03.02.2016 at 11:39 by Romain Stomp
Since LabOne 15.11 release and onward, accessible from our download area, all HF2LI users with the enabled HF2LI-WEB option can now benefit from the latest software developments that were previously reserved for the UHFLI. One tool that is now totally new for this […]

LabOne Software Trigger as a tool for multichannel mapping applications

on 25.11.2015 at 13:27 by Romain Stomp
In earlier blogs, we presented several methods to synchronize data acquisition with third party instruments, either via the DIO input as a Hardware trigger (TTL pulse), some gated triggering scheme for pass/fail analysis or to capture only transient phenomena in a longer […]

Pass/Fail Tests for Failure Analysis

on 08.06.2015 at 16:34 by Romain Stomp
For quality control in manufacturing process, there are many ways to tests for transistors or other component failure, but for high throughput verification usually simple Pass/Fail tests are required. Since devices are tested for various functions, different tests need to be performed […]

Synchronization of HF2LI/UHFLI with External Scan Engines for Image Acquisition

on 10.09.2014 at 23:50 by Romain Stomp
Since a lock-in amplifier is most of all used for synchronous measurements, it comes at no surprise that many HF2 or UHF users want to synchronize saved demodulated sample with their scan generator either for mapping, scanning or imaging in […]

How to Achieve More Stable Z-feedback in FM-AFM Mode

on 15.05.2014 at 16:38 by Romain Stomp
The challenge with FM-AFM mode (or NC-AFM for Non-Contact Atomic Force Microscopy) is that tip-sample interaction can be either attractive (negative frequency shift, -df) or repulsive (positive frequency shift, +df) which leads to different parameter settings for the Z feedback […]

DC Offsets Measurement with the HF2LI Lock-in Amplifier

on 04.10.2013 at 11:55 by Romain Stomp
At first thought, DC measurements might be outside the scope of standard lock-in amplifiers. With the HF2LI one has several tools to monitor and record the DC offset while measuring the modulated signal. In practice, many customers need to record […]