Posts in Category UHFLI

Webinar Summary – Boost Your SPM Applications: From Kelvin Probe to Time-Resolved Measurements

on 19.10.2020 at 17:03 by Romain Stomp
Following up on the webinar dedicated to Kelvin Probe Force Microscopy (KPFM) techniques, I’d like to post a short summary in this blog as well as answers to most questions raised during this event. The recording of this webinar can […]

Compensating delay-induced phase shifts for high-frequency resonators

on 20.02.2017 at 14:31 by Romain Stomp
Phase-Locked Loop (PLL) or other PID controllers on nano-mechanical resonators rely on clean phase signals that exhibit large slope, or significant phase shift, around the resonance frequency. For really high-frequency NEMS and opto-mechanical systems above a few tens or hundreds […]

LabOne Software Trigger as a tool for multichannel mapping applications

on 25.11.2015 at 13:27 by Romain Stomp
In earlier blogs, we presented several methods to synchronize data acquisition with third party instruments, either via the DIO input as a Hardware trigger (TTL pulse), some gated triggering scheme for pass/fail analysis or to capture only transient phenomena in a longer […]

Pass/Fail Tests for Failure Analysis

on 08.06.2015 at 16:34 by Romain Stomp
For quality control in manufacturing process, there are many ways to tests for transistors or other component failure, but for high throughput verification usually simple Pass/Fail tests are required. Since devices are tested for various functions, different tests need to be performed […]

What it Takes for High-Speed AFM Measurements

on 19.02.2014 at 14:06 by Romain Stomp
Typically for biological and catalysis applications, time matters! And AFM images that record in 10 minutes or more are not acceptable. We often receive inquiries about what constitutes a complete solution for ‘fast AFM’ and what Zurich Instruments can offer […]

Ring-Down Method for Rapid Determination of High Q-factor Resonators

on 18.12.2013 at 15:45 by Romain Stomp
With the miniaturization of circuits and components such as MEMS and now also NEMS (Nano-Electro-Mechanical Systems), the variety and quality of macro-fabricated devices have dramatically increased, leading to packaged or embedded systems with particularly sensitive electromechanical properties. The basic properties, […]