Posts tagged AFM/SPM

Resonance enhancement: a tale of two data analysis methods

on 17.09.2019 at 11:37 by Romain Stomp
The Benefit and Challenge of using Resonance Enhancement Resonance enhancement technique is the fastlane toward raising signal well above the noise floor to increase signal-to-noise ratio (SNR) and dynamical range. Such an approach is common for Scanning Probe Microscopy (SPM) […]

Workshop on Nanomechanics – Montpellier, France

on 09.12.2016 at 11:24 by Romain Stomp
This workshop organized with CNRS customers in Montpellier among the RéMiSoL network (Réseau des Microscopies à Sondes Locales) focused on all aspects of contact mechanics at the nanoscale and in particular using resonant contact AFM mode (CR-AFM). Contact Resonance tracking measures the […]

LabOne Software Trigger as a tool for multichannel mapping applications

on 25.11.2015 at 13:27 by Romain Stomp
In earlier blogs, we presented several methods to synchronize data acquisition with third party instruments, either via the DIO input as a Hardware trigger (TTL pulse), some gated triggering scheme for pass/fail analysis or to capture only transient phenomena in a longer […]

DFRT-PFM workshop – INL Lyon

on 27.11.2014 at 16:54 by Romain Stomp
Earlier in November 2014, Zurich Instruments participated in a 2-day workshop on Piezoresponse Force Microscopy (PFM) organized by the Institut des Nanotechnologies de Lyon (INL) and the CNRS network RéMiSoL (Réseau des Microscopies à Sondes Locales). Starting with some theoretical introduction […]

Synchronization of HF2LI/UHFLI with External Scan Engines for Image Acquisition

on 10.09.2014 at 23:50 by Romain Stomp
Since a lock-in amplifier is most of all used for synchronous measurements, it comes at no surprise that many HF2 or UHF users want to synchronize saved demodulated sample with their scan generator either for mapping, scanning or imaging in […]

How to Achieve More Stable Z-feedback in FM-AFM Mode

on 15.05.2014 at 16:38 by Romain Stomp
The challenge with FM-AFM mode (or NC-AFM for Non-Contact Atomic Force Microscopy) is that tip-sample interaction can be either attractive (negative frequency shift, -df) or repulsive (positive frequency shift, +df) which leads to different parameter settings for the Z feedback […]

What it Takes for High-Speed AFM Measurements

on 19.02.2014 at 14:06 by Romain Stomp
Typically for biological and catalysis applications, time matters! And AFM images that record in 10 minutes or more are not acceptable. We often receive inquiries about what constitutes a complete solution for ‘fast AFM’ and what Zurich Instruments can offer […]