Posts tagged Failure Analysis

LabOne Software Trigger as a tool for multichannel mapping applications

on 25.11.2015 at 13:27 by Romain Stomp
In earlier blogs, we presented several methods to synchronize data acquisition with third party instruments, either via the DIO input as a Hardware trigger (TTL pulse), some gated triggering scheme for pass/fail analysis or to capture only transient phenomena in a longer […]

Pass/Fail Tests for Failure Analysis

on 08.06.2015 at 16:34 by Romain Stomp
For quality control in manufacturing process, there are many ways to tests for transistors or other component failure, but for high throughput verification usually simple Pass/Fail tests are required. Since devices are tested for various functions, different tests need to be performed […]